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International Patent: DOHERTY AMPLIFIER

GENEVA, July 1 -- MITSUBISHI ELECTRIC CORPORATION filed a patent application (JP2024/044299) for “DOHERTY AMPLIFIER”. With publication no. WO/2026/126499, here are the other details related to the pat... Read More


International Patent: OBJECT CHARACTERISTIC ESTIMATION DEVICE, METHOD, AND PROGRAM

GENEVA, July 1 -- NTT, INC. filed a patent application (JP2024/044273) for “OBJECT CHARACTERISTIC ESTIMATION DEVICE, METHOD, AND PROGRAM”. With publication no. WO/2026/126491, here are the other detai... Read More


International Patent: MANAGEMENT DEVICE AND MANAGEMENT METHOD

GENEVA, July 1 -- NTT DOCOMO, INC. filed a patent application (JP2024/044279) for “MANAGEMENT DEVICE AND MANAGEMENT METHOD”. With publication no. WO/2026/126493, here are the other details related to ... Read More


International Patent: TERMINAL, INFORMATION PROCESSING METHOD, INFORMATION PROCESSING PROGRAM, AND INFORMATION PROCESSING SYSTEM

GENEVA, July 1 -- PIONEER CORPORATION filed a patent application (JP2024/044285) for “TERMINAL, INFORMATION PROCESSING METHOD, INFORMATION PROCESSING PROGRAM, AND INFORMATION PROCESSING SYSTEM”. With ... Read More


International Patent: ABSORBENT ARTICLE

GENEVA, July 1 -- UNICHARM CORPORATION filed a patent application (JP2024/044238) for “ABSORBENT ARTICLE”. With publication no. WO/2026/126484, here are the other details related to the patent applica... Read More


International Patent: SUSPECTED FAILURE LOCATION ESTIMATING DEVICE AND SUSPECTED FAILURE LOCATION ESTIMATING METHOD

GENEVA, July 1 -- NTT, INC. filed a patent application (JP2024/044271) for “SUSPECTED FAILURE LOCATION ESTIMATING DEVICE AND SUSPECTED FAILURE LOCATION ESTIMATING METHOD”. With publication no. WO/2026... Read More


International Patent: MUSICAL PIECE ANALYSIS DEVICE, MUSICAL PIECE ANALYSIS METHOD, AND PROGRAM

GENEVA, July 1 -- ALPHATHETA CORPORATION filed a patent application (JP2024/044225) for “MUSICAL PIECE ANALYSIS DEVICE, MUSICAL PIECE ANALYSIS METHOD, AND PROGRAM”. With publication no. WO/2026/126479... Read More


International Patent: DEFECT INSPECTION SYSTEM, DEFECT INSPECTION METHOD, AND COMPUTER

GENEVA, July 1 -- HITACHI HIGH-TECH CORPORATION filed a patent application (JP2024/044231) for “DEFECT INSPECTION SYSTEM, DEFECT INSPECTION METHOD, AND COMPUTER”. With publication no. WO/2026/126483, ... Read More


International Patent: PLASMA PROCESSING METHOD

GENEVA, July 1 -- HITACHI HIGH-TECH CORPORATION filed a patent application (JP2024/044209) for “PLASMA PROCESSING METHOD”. With publication no. WO/2026/126475, here are the other details related to th... Read More


International Patent: VEHICLE-WIDTH-DIRECTION END PORTION STRUCTURE OF BATTERY PACK

GENEVA, July 1 -- MITSUBISHI JIDOSHA KOGYO KABUSHIKI KAISHA filed a patent application (JP2024/044211) for “VEHICLE-WIDTH-DIRECTION END PORTION STRUCTURE OF BATTERY PACK”. With publication no. WO/2026... Read More